Inventor · disambiguated record
Yukio Tsuzuki
Also filed as: TSUZUKI YUKIO
38 granted patents·1,046 citations·filing 1985–2014
98Inventor score
Top patents by PatentIndex Score
38 records- 0197US6717785B2Semiconductor switching element driving circuitDENSO CORP·Filed 2001·Granted Apr 6, 2004·119 cites·21 claims
- 0293US7456484B2Semiconductor device having IGBT and diodeDENSO CORP·Filed 2007·Granted Nov 25, 2008·27 cites·12 claims
- 0393US7348244B2Method of producing a semiconductor deviceDENSO CORP·Filed 2006·Granted Mar 25, 2008·22 cites·4 claims
- 0493US5138422ASemiconductor device which includes multiple isolated semiconductor segments on one chipNIPPON DENSO CO·Filed 1991·Granted Aug 11, 1992·192 cites·3 claims
- 0593US4879254AMethod of manufacturing a DMOSNIPPON DENSO CO·Filed 1988·Granted Nov 7, 1989·94 cites·7 claims
- 0693US4760434ASemiconductor device with protective means against overheatingNIPPON DENSO CO·Filed 1986·Granted Jul 26, 1988·107 cites·12 claims
- 0792US8242536B2Semiconductor deviceTANABE HIROMITSU·Filed 2010·Granted Aug 14, 2012·17 cites·19 claims
- 0892US8102025B2Semiconductor device having IGBT and diodeOZEKI YOSHIHIKO·Filed 2007·Granted Jan 24, 2012·34 cites·27 claims
- 0991US8080853B2Semiconductor device including insulated gate bipolar transistor and diodeTSUZUKI YUKIO·Filed 2009·Granted Dec 20, 2011·21 cites·9 claims
- 1089US8841699B2Semiconductor device including insulated gate bipolar transistor and diodeTSUZUKI YUKIO·Filed 2012·Granted Sep 23, 2014·11 cites·6 claims
- 1189US8614483B2Insulated gate semiconductor deviceTANABE HIROMITSU·Filed 2011·Granted Dec 24, 2013·14 cites·33 claims
- 1289US8405122B2Insulated gate semiconductor deviceKOUNO KENJI·Filed 2011·Granted Mar 26, 2013·12 cites·17 claims
- 1389US8168999B2Semiconductor device having IGBT and diodeTSUZUKI YUKIO·Filed 2009·Granted May 1, 2012·17 cites·14 claims
- 1489US7498634B2Semiconductor device having IGBT and diodeDENSO CORP·Filed 2007·Granted Mar 3, 2009·17 cites·26 claims
- 1589US4963505ASemiconductor device and method of manufacturing sameNIPPON DENSO CO·Filed 1988·Granted Oct 16, 1990·96 cites·9 claims
- 1687US7026215B2Method of producing a semiconductor deviceDENSO CORP·Filed 2005·Granted Apr 11, 2006·11 cites·3 claims
- 1785US8847276B2Semiconductor deviceTANABE HIROMITSU·Filed 2011·Granted Sep 30, 2014·8 cites·18 claims
- 1885US7728382B2Semiconductor device having diode and IGBTDENSO CORP·Filed 2008·Granted Jun 1, 2010·11 cites·12 claims
- 1985US4896199ASemiconductor device with protective means against overheatingNIPPON DENSO CO·Filed 1988·Granted Jan 23, 1990·59 cites·7 claims
- 2084US8288824B2Semiconductor device including insulated gate bipolar transistor and diodeTSUZUKI YUKIO·Filed 2011·Granted Oct 16, 2012·7 cites·7 claims
- 2183US7999314B2Semiconductor device and manufacturing method thereofDENSO CORP·Filed 2008·Granted Aug 16, 2011·7 cites·38 claims
- 2279US9224730B2Semiconductor deviceDENSO CORP·Filed 2014·Granted Dec 29, 2015·4 cites·9 claims
- 2379US7692214B2Semiconductor device having IGBT cell and diode cell and method for designing the sameDENSO CORP·Filed 2007·Granted Apr 6, 2010·8 cites·15 claims
- 2479US7126187B2Semiconductor device and a method of producing the sameDENSO CORP·Filed 2003·Granted Oct 24, 2006·19 cites·11 claims
- 2578US8729600B2Insulated gate bipolar transistor (IGBT) with hole stopper layerTSUZUKI YUKIO·Filed 2012·Granted May 20, 2014·5 cites·7 claims
- 2678US8648385B2Semiconductor deviceKOUNO KENJI·Filed 2011·Granted Feb 11, 2014·5 cites·7 claims
- 2776US9099387B2Semiconductor deviceTSUZUKI YUKIO·Filed 2011·Granted Aug 4, 2015·3 cites·4 claims
- 2872US7692221B2Semiconductor device having IGBT elementDENSO CORP·Filed 2007·Granted Apr 6, 2010·5 cites·14 claims
- 2965US7622768B2Semiconductor device and method of manufacturing thereofDENSO CORP·Filed 2005·Granted Nov 24, 2009·3 cites·14 claims
- 3065US6864532B2Semiconductor device and method for manufacturing the sameDENSO CORP·Filed 2002·Granted Mar 8, 2005·10 cites·10 claims
- 3159US8455958B2Insulated gate semiconductor device with well region edge positioned within ring-shaped buffer trenchTSUZUKI YUKIO·Filed 2011·Granted Jun 4, 2013·1 cites·6 claims
- 3257US8125002B2Semiconductor device and inverter circuit having the sameFUKUDA YUTAKA·Filed 2008·Granted Feb 28, 2012·1 cites·16 claims
- 3357US5128823APower semiconductor apparatusNIPPON DENSO CO·Filed 1989·Granted Jul 7, 1992·22 cites·11 claims
- 3456US7667269B2Trench gate type semiconductor deviceDENSO CORP·Filed 2006·Granted Feb 23, 2010·1 cites·7 claims
- 3552US5136348AStructure and manufacturing method for thin-film semiconductor diode deviceNIPPON DENSO CO·Filed 1991·Granted Aug 4, 1992·14 cites·6 claims
- 3651US4672402ASemiconductor circuit device including an overvoltage protection elementNIPPON DENSO CO·Filed 1986·Granted Jun 9, 1987·14 cites·3 claims
- 3749US4680608ASemiconductor deviceNIPPON DENSO CO·Filed 1985·Granted Jul 14, 1987·12 cites·4 claims
- 3847US5594236ASunlight sensorNIPPON DENSO CO·Filed 1994·Granted Jan 14, 1997·16 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →