Inventor · disambiguated record
Heinz Zeininger
Also filed as: ZEININGER HEINZ
3 granted patents·147 citations·filing 1994–1997
76Inventor score
Technology areasH10P
Files withSIEMENS AG3
Top patents by PatentIndex Score
3 records- 0184US5576223AMethod of defect determination and defect engineering on product wafer of advanced submicron technologiesSIEMENS AG·Filed 1994·Granted Nov 19, 1996·112 cites·7 claims
- 0253US5439831ALow junction leakage MOSFETsSIEMENS AG·Filed 1994·Granted Aug 8, 1995·20 cites·8 claims
- 0351US5872382ALow junction leakage mosfets with particular sidewall spacer structureSIEMENS AG·Filed 1997·Granted Feb 16, 1999·15 cites·5 claims
Join the waitlist — get patent alerts
Get an alert when Heinz Zeininger files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →