Inventor · disambiguated record
Ping-Chen Chang
Also filed as: CHANG PING-CHEN
19 granted patents·1 pending application·57 citations·filing 2008–2020
92Inventor score
Top patents by PatentIndex Score
20 records- 0197US9368484B1Fin type electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 14, 2016·28 cites·13 claims
- 0286US10008489B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 26, 2018·4 cites·15 claims
- 0383US10903205B2Semiconductor device of electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jan 26, 2021·3 cites·18 claims
- 0483US10629585B2Electrostatic discharge protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 21, 2020·3 cites·16 claims
- 0582US10008492B2Electrostatic discharge (ESD) protection device and method fabricating the ESD protection deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jun 26, 2018·4 cites·22 claims
- 0681US9093565B2Fin diode structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jul 28, 2015·3 cites·5 claims
- 0779US10897131B2Electrostatic discharge protection circuit for bypassing an ESD currentUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 19, 2021·3 cites·17 claims
- 0874US9466598B1Semiconductor structure suitable for electrostatic discharge protection applicationUNITED MICROELECTRONICS CORP·Filed 2015·Granted Oct 11, 2016·2 cites·12 claims
- 0973US8660025B2Accurate method to evaluate a system reliability of a cloud computing networkLIN YI-KUEI·Filed 2011·Granted Feb 25, 2014·4 cites·8 claims
- 1069US8660024B2Estimation method to evaluate a system reliability of a cloud computing networkLIN YI-KUEI·Filed 2010·Granted Feb 25, 2014·3 cites·7 claims
- 1163US11257807B2Semiconductor device of electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2020·Granted Feb 22, 2022·0 cites·8 claims
- 1256US9559091B2Method of manufacturing fin diode structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jan 31, 2017·0 cites·5 claims
- 1356US9455246B2Fin diode structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 27, 2016·0 cites·4 claims
- 1456US9331064B2Fin diode structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 3, 2016·0 cites·4 claims
- 1550US9748222B2Fin type electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Aug 29, 2017·0 cites·15 claims
- 1644US10522530B2Electrostatic discharge shielding semiconductor device and electrostatic discharge testing method thereofUNITED MICROELECTRONICS CORP·Filed 2018·Granted Dec 31, 2019·0 cites·8 claims
- 1744US8884337B2Output bufferUNITED MICROELECTRONICS CORP·Filed 2013·Granted Nov 11, 2014·0 cites·10 claims
- 1842US10978442B2Electrostatic discharge (ESD) protection device and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 13, 2021·0 cites·18 claims
- 1941US2009101494A1Method for Producing Internal Antenna with Anti-Electromagnetic Interference Property Through Vacuum ProcessMITAC PREC TECHNOLOGY CORP·Filed 2008·Application pending·0 cites
- 2036US9899369B2Layout structure for electrostatic discharge protectionUNITED MICROELECTRONICS CORP·Filed 2015·Granted Feb 20, 2018·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →