Inventor · disambiguated record
Hidetaka Sawada
Also filed as: SAWADA HIDETAKA
21 granted patents·3 pending applications·70 citations·filing 1991–2024
92Inventor score
Top patents by PatentIndex Score
24 records- 0182US8785880B2Chromatic aberration corrector and electron microscopeJEOL LTD·Filed 2013·Granted Jul 22, 2014·5 cites·8 claims
- 0282US8178850B2Chromatic aberration corrector for charged-particle beam system and correction method thereforSAWADA HIDETAKA·Filed 2009·Granted May 15, 2012·7 cites·16 claims
- 0382US7619220B2Method of measuring aberrations and correcting aberrations using Ronchigram and electron microscopeJEOL LTD·Filed 2006·Granted Nov 17, 2009·10 cites·8 claims
- 0475US8541755B1Electron microscopeSAWADA HIDETAKA·Filed 2012·Granted Sep 24, 2013·3 cites·1 claims
- 0573US7723683B2Aberration correction systemJEOL LTD·Filed 2008·Granted May 25, 2010·3 cites·10 claims
- 0669US10541111B2Distortion measurement method for electron microscope image, electron microscope, distortion measurement specimen, and method of manufacturing distortion measurement specimenJEOL LTD·Filed 2018·Granted Jan 21, 2020·1 cites·14 claims
- 0768US9997327B1Liner tube and electron microscopeJEOL LTD·Filed 2016·Granted Jun 12, 2018·1 cites·8 claims
- 0867US9349565B2Multipole lens, aberration corrector, and electron microscopeJEOL LTD·Filed 2015·Granted May 24, 2016·1 cites·13 claims
- 0964US12354827B2Aberration correcting device and electron microscopeJEOL LTD·Filed 2023·Granted Jul 8, 2025·0 cites·8 claims
- 1064US9793088B2Two-stage dodecapole aberration corrector for charged-particle beamSAWADA HIDETAKA·Filed 2009·Granted Oct 17, 2017·2 cites·6 claims
- 1164US2025132118A1Charged Particle Gun and Charged Particle Beam SystemJEOL LTD·Filed 2024·Application pending·0 cites
- 1263US8389951B2Spherical aberration corrector and method of spherical aberration correctionSAWADA HIDETAKA·Filed 2011·Granted Mar 5, 2013·1 cites·13 claims
- 1361US9256068B2Spherical aberration corrector, method of spherical aberration correction, and charged particle beam instrumentJEOL LTD·Filed 2014·Granted Feb 9, 2016·1 cites·13 claims
- 1461US8431897B2Transmission electron microscopeSHIBATA NAOYA·Filed 2011·Granted Apr 30, 2013·2 cites·4 claims
- 1561US2023349839A1Electron Microscope and Aberration Measurement MethodJEOL LTD·Filed 2023·Application pending·0 cites
- 1660US8907298B1Method for axial alignment of charged particle beam and charged particle beam systemJEOL LTD·Filed 2014·Granted Dec 9, 2014·0 cites·8 claims
- 1756US8168956B2Scanning transmission electron microscope and method of aberration correction thereforSAWADA HIDETAKA·Filed 2009·Granted May 1, 2012·0 cites·8 claims
- 1856US5250183AApparatus for manufacturing ultra-pure waterHITACHI SHIPBUILDING ENG CO·Filed 1991·Granted Oct 5, 1993·23 cites·11 claims
- 1955US7598496B2Charged-particle beam systemJEOL LTD·Filed 2007·Granted Oct 6, 2009·0 cites·8 claims
- 2054US8847172B2Method for axial alignment of charged particle beam and charged particle beam systemSAWADA HIDETAKA·Filed 2011·Granted Sep 30, 2014·0 cites·7 claims
- 2150US2008093563A1Aberration Corrector and Method of Aberration CorrectionJEOL LTD·Filed 2007·Application pending·0 cites
- 2245US9859095B2Electron microscope and measurement methodUNIV TOKYO·Filed 2016·Granted Jan 2, 2018·0 cites·7 claims
- 2342US10720301B2Aberration corrector and electron microscopeJEOL LTD·Filed 2019·Granted Jul 21, 2020·0 cites·9 claims
- 2439US5250117ADegreasing-cleaning methodHITACHI SHIPBUILDING ENG CO·Filed 1991·Granted Oct 5, 1993·10 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →