Inventor · disambiguated record
Katsuhiko Inaba
Also filed as: INABA KATSUHIKO
12 granted patents·79 citations·filing 1990–2020
88Inventor score
Top patents by PatentIndex Score
12 records- 0184US11788974B2Control apparatus, system, method, and programRIGAKU DENKI CO LTD·Filed 2020·Granted Oct 17, 2023·1 cites·12 claims
- 0280US9218315B2X-ray analysis apparatusRIGAKU DENKI CO LTD·Filed 2012·Granted Dec 22, 2015·4 cites·9 claims
- 0378US9074992B2X-ray diffraction apparatus and X-ray diffraction measurement methodOZAWA TETSUYA·Filed 2011·Granted Jul 7, 2015·3 cites·16 claims
- 0475US7684543B2X-ray beam conditioning device and X-ray analysis apparatusRIGAKU DENKI CO LTD·Filed 2006·Granted Mar 23, 2010·10 cites·20 claims
- 0575US6999557B2Method of setting measuring range of reciprocal-space mappingRIGAKU DENKI CO LTD·Filed 2004·Granted Feb 14, 2006·13 cites·6 claims
- 0673US6970532B2Method and apparatus for measuring thin film, and thin film deposition systemRIGAKU DENKI CO LTD·Filed 2001·Granted Nov 29, 2005·13 cites·5 claims
- 0768US9086367B2X-ray intensity correction method and X-ray diffractometerRIGAKU DENKI CO LTD·Filed 2012·Granted Jul 21, 2015·1 cites·10 claims
- 0867US7680246B2Method and device for judging polarity of single crystal sampleRIGAKU DENKI CO LTD·Filed 2006·Granted Mar 16, 2010·2 cites·12 claims
- 0967US5063489ASwitching regulator having improved switching control arrangementNEC CORP·Filed 1990·Granted Nov 5, 1991·32 cites·3 claims
- 1057US10837923B2X-ray analysis device and method for optical axis alignment thereofRIGAKU DENKI CO LTD·Filed 2019·Granted Nov 17, 2020·0 cites·5 claims
- 1149US10444168B2Method and apparatus for measuring bowing of single-crystal substrateRIGAKU DENKI CO LTD·Filed 2014·Granted Oct 15, 2019·0 cites·1 claims
- 1245US10585053B2X-ray diffractometerRIGAKU DENKI CO LTD·Filed 2017·Granted Mar 10, 2020·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →