Inventor · disambiguated record
Nagaraj Savithri
Also filed as: SAVITHRI NAGARAJ · SAVITHRI NAGARAJ N · SAVITHRI NAGARAJ NARASIMH
24 granted patents·1 pending application·976 citations·filing 1997–2017
96Inventor score
Top patents by PatentIndex Score
25 records- 0195US6499131B1Method for verification of crosstalk noise in a CMOS designTEXAS INSTRUMENTS INC·Filed 2000·Granted Dec 24, 2002·289 cites·12 claims
- 0294US6378109B1Method of simulation for gate oxide integrity check on an entire ICTEXAS INSTRUMENTS INC·Filed 2000·Granted Apr 23, 2002·276 cites·13 claims
- 0389US7694269B2Method for positioning sub-resolution assist featuresTEXAS INSTRUMENTS INC·Filed 2007·Granted Apr 6, 2010·12 cites·23 claims
- 0486US6493853B1Cell-based noise characterization and evaluationTEXAS INSTRUMENTS INC·Filed 2000·Granted Dec 10, 2002·46 cites·13 claims
- 0585US10162916B1Timing verification in a programmable circuit design using variation factorsXILINX INC·Filed 2017·Granted Dec 25, 2018·6 cites·18 claims
- 0683US6038383AMethod and apparatus for determining signal line interconnect widths to ensure electromigration reliabilityTEXAS INSTRUMENTS INC·Filed 1997·Granted Mar 14, 2000·137 cites·22 claims
- 0781US9372948B1Interconnect speed model characterization in programmable integrated circuitsXILINX INC·Filed 2015·Granted Jun 21, 2016·2 cites·20 claims
- 0880US9915696B1Area-efficient performance monitors for adaptive voltage scalingXILINX INC·Filed 2015·Granted Mar 13, 2018·2 cites·20 claims
- 0978US9639640B1Generation of delay values for a simulation model of circuit elements in a clock networkXILINX INC·Filed 2015·Granted May 2, 2017·3 cites·20 claims
- 1078US8013635B2Multi-mode circuit and a method for preventing degradation in the multi-mode circuitTEXAS INSTRUMENTS INC·Filed 2010·Granted Sep 6, 2011·6 cites·17 claims
- 1176US9065446B1Generating delay values for different contexts of a circuitXILINX INC·Filed 2014·Granted Jun 23, 2015·4 cites·20 claims
- 1276US6732339B2Cell-based noise characterization and evaluationTEXAS INSTRUMENTS INC·Filed 2002·Granted May 4, 2004·28 cites·7 claims
- 1374US9501604B1Testing critical paths of a circuit designXILINX INC·Filed 2014·Granted Nov 22, 2016·5 cites·20 claims
- 1474US6363516B1Method for hierarchical parasitic extraction of a CMOS designTEXAS INSTRUMENTS INC·Filed 1999·Granted Mar 26, 2002·84 cites·9 claims
- 1570US10289784B1Determination of clock path delays and implementation of a circuit designXILINX INC·Filed 2017·Granted May 14, 2019·1 cites·16 claims
- 1668US6253359B1Method for analyzing circuit delays caused by capacitive coupling in digital circuitsTEXAS INSTRUMENTS INC·Filed 1999·Granted Jun 26, 2001·53 cites·19 claims
- 1765US6700399B1High density parasitic measurement structureTEXAS INSTRUMENTS INC·Filed 2002·Granted Mar 2, 2004·9 cites·20 claims
- 1863US7441218B2Contact resistance and capacitance for semiconductor devicesTEXAS INSTRUMENTS INC·Filed 2006·Granted Oct 21, 2008·2 cites·11 claims
- 1962US9405871B1Determination of path delays in circuit designsXILINX INC·Filed 2014·Granted Aug 2, 2016·1 cites·20 claims
- 2056US7109738B2Method for modeling inductive effects on circuit performanceTEXAS INSTRUMENTS INC·Filed 2004·Granted Sep 19, 2006·5 cites·3 claims
- 2153US8112737B2Contact resistance and capacitance for semiconductor devicesSAVITHRI NAGARAJ N·Filed 2008·Granted Feb 7, 2012·1 cites·11 claims
- 2252US9885750B1Speed model tuning for programmable integrated circuits with consideration of device yield, simulated frequency of operation, and speed of device componentsXILINX INC·Filed 2015·Granted Feb 6, 2018·0 cites·20 claims
- 2348US2009250698A1Fabrication management systemSAVITHRI NAGARAJ·Filed 2009·Application pending·0 cites
- 2445US7129696B2Method for capacitance measurement in siliconTEXAS INSTRUMENTS INC·Filed 2004·Granted Oct 31, 2006·4 cites·15 claims
- 2544US7318208B2Method for circuit sensitivity driven parasitic extractionTEXAS INSTRUMENTS INC·Filed 2005·Granted Jan 8, 2008·0 cites·9 claims
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