Inventor · disambiguated record
A. Kathleen Hennessey
Also filed as: HENNESSEY A KATHLEEN
12 granted patents·1,537 citations·filing 1994–2006
95Inventor score
Files withTEXAS INSTRUMENTS INC7BEACON SYS INC1ISOA INC1KONSULTEUROPE LTD LTD JOINT ST1KONSULTEUROPE LTD LTD LIABILIT1
Top patents by PatentIndex Score
12 records- 0195US6483938B1System and method for classifying an anomalyTEXAS INSTRUMENTS INC·Filed 2000·Granted Nov 19, 2002·176 cites·9 claims
- 0294US7295019B2Security scanners with capacitance and magnetic sensor arraysKONSULTEUROPE LTD LTD LIABILIT·Filed 2006·Granted Nov 13, 2007·91 cites·18 claims
- 0394US6205239B1System and method for circuit repairTEXAS INSTRUMENTS INC·Filed 1997·Granted Mar 20, 2001·230 cites·12 claims
- 0494US6091846AMethod and system for anomaly detectionTEXAS INSTRUMENTS INC·Filed 1997·Granted Jul 18, 2000·250 cites·14 claims
- 0593US6292582B1Method and system for identifying defects in a semiconductorFiled 1997·Granted Sep 18, 2001·239 cites·13 claims
- 0693US6246787B1System and method for knowledgebase generation and managementTEXAS INSTRUMENTS INC·Filed 1997·Granted Jun 12, 2001·190 cites·9 claims
- 0788US7119553B2Security scanners with capacitance and magnetic sensor arraysKONSULTEUROPE LTD LTD JOINT ST·Filed 2005·Granted Oct 10, 2006·100 cites·21 claims
- 0887US5696835AApparatus and method for aligning and measuring misregistrationTEXAS INSTRUMENTS INC·Filed 1996·Granted Dec 9, 1997·107 cites·3 claims
- 0976US5515453AApparatus and method for image processing in symbolic spaceBEACON SYS INC·Filed 1994·Granted May 7, 1996·94 cites·15 claims
- 1073US6864971B2System and method for performing optical inspection utilizing diffracted lightISOA INC·Filed 2002·Granted Mar 8, 2005·13 cites·22 claims
- 1156US5703969ASystem and method for recognizing visual indiciaTEXAS INSTRUMENTS INC·Filed 1996·Granted Dec 30, 1997·39 cites·9 claims
- 1235US5553168ASystem and method for recognizing visual indiciaTEXAS INSTRUMENTS INC·Filed 1994·Granted Sep 3, 1996·8 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →