Assignee
YIELDBOOST TECH INC
US·12 granted patents·1 pending application·28 citations·filing 2003–2004
Top patents by PatentIndex Score
13 records- 0174US7053645B2System and method for detecting defects in a thin-film-transistor arrayYIELDBOOST TECH INC·Filed 2003·Granted May 30, 2006·16 cites·29 claims
- 0248US7024338B2System and method for improving TFT-array manufacturing yieldsYIELDBOOST TECH INC·Filed 2003·Granted Apr 4, 2006·3 cites·8 claims
- 0348US6982556B2System and method for classifying defects in and identifying process problems for an electrical circuitYIELDBOOST TECH INC·Filed 2003·Granted Jan 3, 2006·4 cites·45 claims
- 0446US7154292B2Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the sameYIELDBOOST TECH INC·Filed 2003·Granted Dec 26, 2006·2 cites·24 claims
- 0546US6996446B2System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing processYIELDBOOST TECH INC·Filed 2003·Granted Feb 7, 2006·1 cites·44 claims
- 0646US6960927B2System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing processYIELDBOOST TECH INC·Filed 2003·Granted Nov 1, 2005·1 cites·23 claims
- 0746US6862489B2System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing processYIELDBOOST TECH INC·Filed 2003·Granted Mar 1, 2005·1 cites·20 claims
- 0841US2004249608A1System and method for detecting defects in a thin-film-transistor arrayYIELDBOOST TECH INC·Filed 2003·Application pending·0 cites
- 0940US7064572B2System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing processYIELDBOOST TECH INC·Filed 2003·Granted Jun 20, 2006·0 cites·19 claims
- 1040US6949944B2System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing processYIELDBOOST TECH INC·Filed 2003·Granted Sep 27, 2005·0 cites·25 claims
- 1140US6888368B2System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing processYIELDBOOST TECH INC·Filed 2003·Granted May 3, 2005·0 cites·33 claims
- 1240US6850086B2System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing processYIELDBOOST TECH INC·Filed 2003·Granted Feb 1, 2005·0 cites·30 claims
- 1337US7042244B2Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the sameYIELDBOOST TECH INC·Filed 2004·Granted May 9, 2006·0 cites·26 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →