Assignee
YEREMIN DMITRIY
0 granted patents·2 pending applications·0 citations·filing 2005–2006
Top patents by PatentIndex Score
2 records- 0138US2007081742A1Method of measuring an area of micro-objects of arbitrary shape in scanning electron microscopeYEREMIN DMITRIY·Filed 2005·Application pending·0 cites
- 0237US2008114561A1Method of determining micro- and nano- sizes in scanning electron microscopeYEREMIN DMITRIY·Filed 2006·Application pending·0 cites
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