Assignee
YANG GI-YOUNG
KR·2 granted patents·6 citations·filing 2008–2009
Top patents by PatentIndex Score
2 records- 0168US8108159B2Method of detecting degradation of semiconductor devices and method of detecting degradation of integrated circuitsYANG GI-YOUNG·Filed 2008·Granted Jan 31, 2012·3 cites·23 claims
- 0263US8281268B2Method and system detecting metal line failureYANG GI-YOUNG·Filed 2009·Granted Oct 2, 2012·3 cites·14 claims
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