Assignee
YANG BYUNG CHUN
US·2 granted patents·26 citations·filing 2008–2010
Top patents by PatentIndex Score
2 records- 0181US8207060B2High yield and high throughput method for the manufacture of integrated circuit devices of improved integrity, performance and reliabilityYANG BYUNG CHUN·Filed 2008·Granted Jun 26, 2012·16 cites·36 claims
- 0280US8703605B2High yield and high throughput method for the manufacture of integrated circuit devices of improved integrity, performance and reliabilityYANG BYUNG CHUN·Filed 2010·Granted Apr 22, 2014·10 cites·61 claims
Join the waitlist — get patent alerts
Get an alert when YANG BYUNG CHUN files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →