Assignee
YAMAZAKI YOSHIROU
JP·10 granted patents·2 pending applications·73 citations·filing 2008–2012
Top patents by PatentIndex Score
12 records- 0198US8891128B2Defective recording element detecting apparatus and method, and image forming apparatus and methodYAMAZAKI YOSHIROU·Filed 2011·Granted Nov 18, 2014·31 cites·11 claims
- 0293US8740339B2Defective recording element detecting apparatus, defective recording element detecting method, and image forming apparatusYAMAZAKI YOSHIROU·Filed 2011·Granted Jun 3, 2014·8 cites·11 claims
- 0393US8646869B2Recording position error measurement apparatus and method, image forming apparatus and method, and computer-readable mediumYAMAZAKI YOSHIROU·Filed 2012·Granted Feb 11, 2014·17 cites·12 claims
- 0481US8472069B2Dot position measurement method and apparatus, and computer readable mediumYAMAZAKI YOSHIROU·Filed 2010·Granted Jun 25, 2013·5 cites·26 claims
- 0578US8462381B2Dot position measurement method, dot position measurement apparatus, and computer readable mediumYAMAZAKI YOSHIROU·Filed 2009·Granted Jun 11, 2013·5 cites·18 claims
- 0675US8167412B2Dot position measurement method, dot position measurement apparatus, and computer readable mediumYAMAZAKI YOSHIROU·Filed 2009·Granted May 1, 2012·4 cites·17 claims
- 0765US8911055B2Dot position measurement method and dot position measurement apparatusYAMAZAKI YOSHIROU·Filed 2010·Granted Dec 16, 2014·1 cites·10 claims
- 0864US8287079B2Landing position determining method and device for processing-liquid ejection nozzles, and inkjet recording apparatusYAMAZAKI YOSHIROU·Filed 2009·Granted Oct 16, 2012·2 cites·13 claims
- 0944US8123325B2Non-ejecting nozzle detecting method and device and inkjet recording apparatusYAMAZAKI YOSHIROU·Filed 2009·Granted Feb 28, 2012·0 cites·16 claims
- 1043US2009085952A1Test chart, test chart measurement method, and test chart measurement apparatusYAMAZAKI YOSHIROU·Filed 2008·Application pending·0 cites
- 1137US8388088B2Dot position measurement method and apparatus, and computer readable mediumYAMAZAKI YOSHIROU·Filed 2010·Granted Mar 5, 2013·0 cites·33 claims
- 1237US2011227988A1Fine pattern position detection method and apparatus, defective nozzle detection method and apparatus, and liquid ejection method and apparatusYAMAZAKI YOSHIROU·Filed 2011·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →