Assignee
XITRONIX CORP
US·2 granted patents·31 citations·filing 2005–2006
Top patents by PatentIndex Score
2 records- 0185US7391507B2Method of photo-reflectance characterization of strain and active dopant in semiconductor structuresXITRONIX CORP·Filed 2006·Granted Jun 24, 2008·18 cites·19 claims
- 0282US7239392B2Polarization modulation photoreflectance characterization of semiconductor electronic interfacesXITRONIX CORP·Filed 2005·Granted Jul 3, 2007·13 cites·32 claims
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