Assignee
WANG YONGJIANG
US·6 granted patents·23 citations·filing 2009–2012
Top patents by PatentIndex Score
6 records- 0186US8862954B1Integrated circuit scan testing with stop-clock and auto-step featuresWANG YONGJIANG·Filed 2011·Granted Oct 14, 2014·7 cites·24 claims
- 0282US8954622B1Embedded programmable logic for logic stacking on application processorWANG YONGJIANG·Filed 2012·Granted Feb 10, 2015·7 cites·12 claims
- 0375US8198925B1Digital power on resetWANG YONGJIANG·Filed 2009·Granted Jun 12, 2012·7 cites·15 claims
- 0463US8627155B1Integrated circuit testing with clock manipulation and auto-step featuresWANG YONGJIANG·Filed 2011·Granted Jan 7, 2014·1 cites·18 claims
- 0561US8810289B1Digital power on resetWANG YONGJIANG·Filed 2012·Granted Aug 19, 2014·1 cites·13 claims
- 0644US8299618B2Metal programmable logic and multiple function pin interfaceWANG YONGJIANG·Filed 2010·Granted Oct 30, 2012·0 cites·16 claims
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