Assignee
WANG CHIEN-PING
TW·3 granted patents·2 citations·filing 2011–2012
Technology mixG01R3
Top patents by PatentIndex Score
3 records- 0163US9557368B2Method of measuring thermal electric characteristics of semiconductor deviceWANG CHIEN-PING·Filed 2012·Granted Jan 31, 2017·2 cites·19 claims
- 0237US9110125B2Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor deviceWANG CHIEN-PING·Filed 2012·Granted Aug 18, 2015·0 cites·12 claims
- 0333US8773158B2Inspection methodWANG CHIEN-PING·Filed 2011·Granted Jul 8, 2014·0 cites·23 claims
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