Assignee
WANG CHANGTING
US·2 granted patents·1 pending application·11 citations·filing 2008–2011
Top patents by PatentIndex Score
3 records- 0179US8884614B2Eddy current array probeWANG CHANGTING·Filed 2011·Granted Nov 11, 2014·5 cites·6 claims
- 0275US8269489B2System and method for eddy current inspection of parts with complex geometriesWANG CHANGTING·Filed 2008·Granted Sep 18, 2012·6 cites·12 claims
- 0335US2012043962A1Method and apparatus for eddy current inspection of case-hardended metal componentsWANG CHANGTING·Filed 2010·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →