Assignee
WALKER DARRYL
7 granted patents·300 citations·filing 2006–2008
Top patents by PatentIndex Score
7 records- 0199US7383149B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2006·Granted Jun 3, 2008·69 cites·17 claims
- 0298US7480588B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2007·Granted Jan 20, 2009·56 cites·70 claims
- 0397US7654736B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2008·Granted Feb 2, 2010·41 cites·19 claims
- 0497US7603249B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2007·Granted Oct 13, 2009·41 cites·19 claims
- 0597US7535786B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2007·Granted May 19, 2009·42 cites·20 claims
- 0696US7760570B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2007·Granted Jul 20, 2010·30 cites·10 claims
- 0794US7720627B1Semiconductor device having variable parameter selection based on temperature and test methodWALKER DARRYL·Filed 2008·Granted May 18, 2010·21 cites·18 claims
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