Assignee
VOLK WILLIAM
US·1 granted patent·2 pending applications·14 citations·filing 2004–2007
Top patents by PatentIndex Score
3 records- 0179US9002497B2Methods and systems for inspection of wafers and reticles using designer intent dataVOLK WILLIAM·Filed 2004·Granted Apr 7, 2015·14 cites·39 claims
- 0246US2007294177A1Mobile content publishing system and methodVOLK WILLIAM·Filed 2006·Application pending·0 cites
- 0335US2009060317A1Mask defect repair through wafer plane modelingVOLK WILLIAM·Filed 2007·Application pending·0 cites
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