Assignee
VISTEC SEMICONDUCTOR SYSTEMS J
DE·5 granted patents·4 pending applications·5 citations·filing 2002–2009
Top patents by PatentIndex Score
9 records- 0161US7561984B2Method for calculating a model spectrumVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2007·Granted Jul 14, 2009·2 cites·7 claims
- 0252US7084965B2Arrangement and method for inspecting unpatterned wafersVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2002·Granted Aug 1, 2006·1 cites·21 claims
- 0345US7349106B2Apparatus and method for thin-layer metrologyVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2004·Granted Mar 25, 2008·2 cites·16 claims
- 0442US7277190B2Measurement system with an optical measurement arrangementVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2004·Granted Oct 2, 2007·0 cites·9 claims
- 0537US2007076943A1Method and apparatus for inspecting a waferVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2006·Application pending·0 cites
- 0636US2009309285A1Device for holding disk-shaped objectsVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2009·Application pending·0 cites
- 0735US2007174014A1Method for matching a model spectrum to a measured spectrumVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2007·Application pending·0 cites
- 0835US2008203636A1Apparatus for holding disk-like objectsVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2008·Application pending·0 cites
- 0933US7426024B2System for inspecting a disk-shaped objectVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2005·Granted Sep 16, 2008·0 cites·7 claims
Join the waitlist — get patent alerts
Get an alert when VISTEC SEMICONDUCTOR SYSTEMS J files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →