Assignee
VISHAY GENERAL SEMICONDUCTOR I
US·3 granted patents·15 citations·filing 2003–2008
Top patents by PatentIndex Score
3 records- 0179US7374293B2Apparatus, system and method for testing electronic elementsVISHAY GENERAL SEMICONDUCTOR I·Filed 2005·Granted May 20, 2008·9 cites·14 claims
- 0255US7768104B2Apparatus and method for series connection of two die or chips in single electronics packageVISHAY GENERAL SEMICONDUCTOR I·Filed 2008·Granted Aug 3, 2010·2 cites·24 claims
- 0355US7304347B2Method for fabricating a power semiconductor device having a voltage sustaining layer with a terraced trench facilitating formation of floating islandsVISHAY GENERAL SEMICONDUCTOR I·Filed 2003·Granted Dec 4, 2007·4 cites·18 claims
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