Assignee
UPA TECHNOLOGY INC
US·6 granted patents·91 citations·filing 1979–1986
Top patents by PatentIndex Score
6 records- 0173US4245189AProbe assembly for measuring conductivity of plated through holesUPA TECHNOLOGY INC·Filed 1979·Granted Jan 13, 1981·28 cites·18 claims
- 0270US4343092AProbe guide and holderUPA TECHNOLOGY INC·Filed 1980·Granted Aug 10, 1982·24 cites·5 claims
- 0357US4860329AX-ray fluorescence thickness measuring deviceUPA TECHNOLOGY INC·Filed 1986·Granted Aug 22, 1989·22 cites·16 claims
- 0443US4646341ACalibration standard for X-ray fluorescence thicknessUPA TECHNOLOGY INC·Filed 1985·Granted Feb 24, 1987·13 cites·7 claims
- 0525US4437000AAperture piece and method for calibrating backscatter thickness measuring instruments for measuring concave workpiecesUPA TECHNOLOGY INC·Filed 1981·Granted Mar 13, 1984·0 cites·2 claims
- 0623US4449048AWorkpiece positioning system for beta ray measuring instrumentsUPA TECHNOLOGY INC·Filed 1982·Granted May 15, 1984·4 cites·5 claims
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