Assignee
UNITECHNO INC
JP·10 granted patents·161 citations·filing 1996–2018
Top patents by PatentIndex Score
10 records- 0184US6210173B1Electrical connector incorporating an elastic electrically conductive materialUNITECHNO INC·Filed 1999·Granted Apr 3, 2001·48 cites·18 claims
- 0280US6079987AConnector for electronic partsUNITECHNO INC·Filed 1998·Granted Jun 27, 2000·61 cites·10 claims
- 0373US6942493B2Connector structure for connecting electronic partsUNITECHNO INC·Filed 2002·Granted Sep 13, 2005·21 cites·13 claims
- 0470US7402995B2Jig device for transporting and testing integrated circuit chipUNITECHNO INC·Filed 2005·Granted Jul 22, 2008·9 cites·6 claims
- 0564US11394148B2Contact probe and inspection socket provided with contact probeUNITECHNO INC·Filed 2018·Granted Jul 19, 2022·2 cites·14 claims
- 0659US7446545B2Anisotropically conductive sheetUNITECHNO INC·Filed 2006·Granted Nov 4, 2008·3 cites·18 claims
- 0755US7598757B2Double ended contact probeUNITECHNO INC·Filed 2005·Granted Oct 6, 2009·2 cites·17 claims
- 0847US5742171ATest device for multi-contact integrated circuitUNITECHNO INC·Filed 1996·Granted Apr 21, 1998·15 cites·14 claims
- 0940US10459027B2Semiconductor test apparatus for testing semiconductor devicesUNITECHNO INC·Filed 2015·Granted Oct 29, 2019·0 cites·6 claims
- 1029US11619652B2Inspection socketUNITECHNO INC·Filed 2018·Granted Apr 4, 2023·0 cites·5 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →