Assignee
TSUNO NATSUKI
JP·2 granted patents·1 pending application·9 citations·filing 2009–2012
Top patents by PatentIndex Score
3 records- 0182US8907279B2Electron microscope and image capturing method using electron beamTSUNO NATSUKI·Filed 2012·Granted Dec 9, 2014·8 cites·19 claims
- 0260US8586920B2Charged particle beam apparatusTSUNO NATSUKI·Filed 2009·Granted Nov 19, 2013·1 cites·19 claims
- 0337US2012292506A1Sample observation method using electron beams and electron microscopeTSUNO NATSUKI·Filed 2010·Application pending·0 cites
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