Assignee
TEST RESEARCH INC
TW·24 granted patents·6 pending applications·57 citations·filing 2003–2024
Top patents by PatentIndex Score
30 records- 0185US9019351B2Three-dimensional image measuring apparatusTEST RESEARCH INC·Filed 2012·Granted Apr 28, 2015·9 cites·15 claims
- 0282US9838612B2Inspecting device and method for inspecting inspection targetTEST RESEARCH INC·Filed 2015·Granted Dec 5, 2017·4 cites·16 claims
- 0380US11067623B2Test system and method of operating the sameTEST RESEARCH INC·Filed 2019·Granted Jul 20, 2021·2 cites·10 claims
- 0480US7529336B2System and method for laminography inspectionTEST RESEARCH INC·Filed 2007·Granted May 5, 2009·8 cites·14 claims
- 0575US10438340B2Automatic optical inspection system and operating method thereofTEST RESEARCH INC·Filed 2017·Granted Oct 8, 2019·2 cites·12 claims
- 0671US9485491B2Optical systemTEST RESEARCH INC·Filed 2014·Granted Nov 1, 2016·2 cites·21 claims
- 0770US10156606B2Multi-chassis test device and test signal transmission apparatus of the sameTEST RESEARCH INC·Filed 2016·Granted Dec 18, 2018·2 cites·18 claims
- 0868US7855567B2Electronic device testing system and methodTEST RESEARCH INC·Filed 2008·Granted Dec 21, 2010·6 cites·23 claims
- 0967US11686768B2System and method of testing single DUT through multiple cores in parallelTEST RESEARCH INC·Filed 2021·Granted Jun 27, 2023·0 cites·16 claims
- 1067US10841561B2Apparatus and method for three-dimensional inspectionTEST RESEARCH INC·Filed 2017·Granted Nov 17, 2020·2 cites·5 claims
- 1166US9140755B2Testing apparatus with backdriving protection functionTEST RESEARCH INC·Filed 2013·Granted Sep 22, 2015·2 cites·7 claims
- 1266US7702982B2Electronic device testing system and methodTEST RESEARCH INC·Filed 2007·Granted Apr 20, 2010·5 cites·15 claims
- 1365US9791387B2Inspection system and method for controlling the sameTEST RESEARCH INC·Filed 2014·Granted Oct 17, 2017·1 cites·18 claims
- 1464US8350575B2Electrical connection defect detection system and methodTEST RESEARCH INC·Filed 2010·Granted Jan 8, 2013·2 cites·12 claims
- 1563US10600174B2Optical inspection apparatusTEST RESEARCH INC·Filed 2015·Granted Mar 24, 2020·1 cites·9 claims
- 1663US9841387B2Inspection method and deviceTEST RESEARCH INC·Filed 2016·Granted Dec 12, 2017·1 cites·14 claims
- 1761US9015541B2Device and method for performing timing analysisTEST RESEARCH INC·Filed 2013·Granted Apr 21, 2015·2 cites·14 claims
- 1860US9423246B2Three-dimensional measurement systemTEST RESEARCH INC·Filed 2013·Granted Aug 23, 2016·2 cites·8 claims
- 1960US7612568B2Open-circuit testing system and methodTEST RESEARCH INC·Filed 2007·Granted Nov 3, 2009·3 cites·13 claims
- 2059US9686517B2Optical system and image compensating method of optical apparatusTEST RESEARCH INC·Filed 2014·Granted Jun 20, 2017·1 cites·19 claims
- 2152US9885561B2Optical inspection systemTEST RESEARCH INC·Filed 2014·Granted Feb 6, 2018·0 cites·20 claims
- 2250US2025298076A1Electrical testing equipmentTEST RESEARCH INC·Filed 2024·Application pending·0 cites
- 2350US2025298071A1Electrical testing equipmentTEST RESEARCH INC·Filed 2024·Application pending·0 cites
- 2445US10139454B2Test device and alternating current power detection method of the sameTEST RESEARCH INC·Filed 2016·Granted Nov 27, 2018·0 cites·16 claims
- 2544US2004150714A1Optical-enhanced apparatus and method for illuminating printed circuit boards for inspectionTEST RESEARCH INC·Filed 2003·Application pending·0 cites
- 2643US9562947B2Testing apparatus for providing per pin level settingTEST RESEARCH INC·Filed 2013·Granted Feb 7, 2017·0 cites·5 claims
- 2741US2013278723A1Three-dimensional measurement system and three-dimensional measurement methodTEST RESEARCH INC·Filed 2013·Application pending·0 cites
- 2838US2014225633A1Fixture, system and method for performing functional testTEST RESEARCH INC·Filed 2013·Application pending·0 cites
- 2932US2017205449A1Test device and alternating current power detection method of the sameTEST RESEARCH INC·Filed 2016·Application pending·0 cites
- 3031US9423242B2Board-warping measuring apparatus and board-warping measuring method thereofTEST RESEARCH INC·Filed 2015·Granted Aug 23, 2016·0 cites·12 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →