Assignee
TERADA SHOHEI
JP·7 granted patents·20 citations·filing 2008–2011
Top patents by PatentIndex Score
7 records- 0183US8410457B2Sample transfer device and sample transferring methodTERADA SHOHEI·Filed 2011·Granted Apr 2, 2013·8 cites·16 claims
- 0281US8134131B2Method and apparatus for observing inside structures, and specimen holderTERADA SHOHEI·Filed 2008·Granted Mar 13, 2012·4 cites·3 claims
- 0373US8436301B2Transmission electron microscope having electron spectrometerTERADA SHOHEI·Filed 2009·Granted May 7, 2013·3 cites·8 claims
- 0469US8263936B2Transmission electron microscope having electron spectroscopeTERADA SHOHEI·Filed 2009·Granted Sep 11, 2012·2 cites·7 claims
- 0568US9024275B2Specimen holder for charged-particle beam apparatusTERADA SHOHEI·Filed 2011·Granted May 5, 2015·2 cites·5 claims
- 0662US8338798B2Sample holder for electron microscopeTERADA SHOHEI·Filed 2010·Granted Dec 25, 2012·1 cites·20 claims
- 0753US8530858B2Transmission electron microscope apparatus comprising electron spectroscope, sample holder, sample stage, and method for acquiring spectral imageTERADA SHOHEI·Filed 2009·Granted Sep 10, 2013·0 cites·14 claims
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