Assignee
TECHINSIGHTS INC
CA·16 granted patents·4 pending applications·6 citations·filing 2014–2023
Top patents by PatentIndex Score
20 records- 0189US11214874B2Method and system for ion beam delayering of a sample and control thereofTECHINSIGHTS INC·Filed 2020·Granted Jan 4, 2022·2 cites·9 claims
- 0282US9915628B2Circuit tracing using a focused ion beamTECHINSIGHTS INC·Filed 2016·Granted Mar 13, 2018·3 cites·19 claims
- 0367US10469777B2Methods, systems and devices relating to distortion correction in imaging devicesTECHINSIGHTS INC·Filed 2016·Granted Nov 5, 2019·1 cites·19 claims
- 0466US11593545B2Integrated circuit imaging, rendering and layout editing system and methodTECHINSIGHTS INC·Filed 2021·Granted Feb 28, 2023·0 cites·32 claims
- 0562US11301988B2Reverse engineering data analysis system, and integrated circuit component data processing tool and method thereofTECHINSIGHTS INC·Filed 2020·Granted Apr 12, 2022·0 cites·26 claims
- 0661US11074389B2Integrated circuit imaging, rendering and layout editing system and methodTECHINSIGHTS INC·Filed 2019·Granted Jul 27, 2021·0 cites·32 claims
- 0759US10803577B2Reverse engineering data analysis system, and integrated circuit component data processing tool and method thereofTECHINSIGHTS INC·Filed 2018·Granted Oct 13, 2020·0 cites·22 claims
- 0857US10489545B2Integrated circuit imaging, rendering and layout editing system and methodTECHINSIGHTS INC·Filed 2017·Granted Nov 26, 2019·0 cites·29 claims
- 0955US10689763B2Method and system for ion beam delayering of a sample and control thereofTECHINSIGHTS INC·Filed 2016·Granted Jun 23, 2020·0 cites·11 claims
- 1055US10550480B2Method and system for ion beam delayering of a sample and control thereofTECHINSIGHTS INC·Filed 2016·Granted Feb 4, 2020·0 cites·12 claims
- 1155US9383327B2Circuit tracing using a focused ion beamTECHINSIGHTS INC·Filed 2014·Granted Jul 5, 2016·0 cites·15 claims
- 1251US2025014323A1Machine learning system and method for object-specific recognitionTECHINSIGHTS INC·Filed 2022·Application pending·0 cites
- 1350US12176177B2Ion beam chamber fluid delivery apparatus and method and ion beam etcher using sameTECHINSIGHTS INC·Filed 2022·Granted Dec 24, 2024·0 cites·18 claims
- 1449US2025104257A1Image registration methods and systemsTECHINSIGHTS INC·Filed 2023·Application pending·0 cites
- 1548US2025148185A1System and method for automatic extraction of integrated circuit component dataTECHINSIGHTS INC·Filed 2023·Application pending·0 cites
- 1646US12498417B2Contrast-enhancing staining system and method and imaging methods and systems related theretoTECHINSIGHTS INC·Filed 2021·Granted Dec 16, 2025·0 cites·26 claims
- 1743US12555241B2System and method for image segmentation from sparse particle impingement dataTECHINSIGHTS INC·Filed 2021·Granted Feb 17, 2026·0 cites·18 claims
- 1841US12165840B2Ion beam delayering system and method, topographically enhanced delayered sample produced thereby, and imaging methods and systems related theretoTECHINSIGHTS INC·Filed 2019·Granted Dec 10, 2024·0 cites·17 claims
- 1941US2022122805A1Ion beam delayering system and method, and endpoint monitoring system and method thereforTECHINSIGHTS INC·Filed 2020·Application pending·0 cites
- 2038US9529040B2Circuit tracing using a focused ion beamTECHINSIGHTS INC·Filed 2015·Granted Dec 27, 2016·0 cites·25 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →