Assignee
TANIGUCHI KOICHI
JP·4 granted patents·16 citations·filing 2010–2010
Top patents by PatentIndex Score
4 records- 0190US8248592B2Defect inspection systemTANIGUCHI KOICHI·Filed 2010·Granted Aug 21, 2012·10 cites·32 claims
- 0282US8759883B2Semiconductor integrated circuitTANIGUCHI KOICHI·Filed 2010·Granted Jun 24, 2014·4 cites·20 claims
- 0375US8494414B2Driving device and image forming apparatusTANIGUCHI KOICHI·Filed 2010·Granted Jul 23, 2013·2 cites·6 claims
- 0454US8314930B2Inspection device and inspection methodTANIGUCHI KOICHI·Filed 2010·Granted Nov 20, 2012·0 cites·11 claims
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