Assignee
SV PROBE PTE LTD
SG·27 granted patents·1 pending application·295 citations·filing 2004–2018
Top patents by PatentIndex Score
28 records- 0192US7638028B2Probe tip platingSV PROBE PTE LTD·Filed 2005·Granted Dec 29, 2009·16 cites·16 claims
- 0292US7279911B2Probe card assembly with dielectric structureSV PROBE PTE LTD·Filed 2005·Granted Oct 9, 2007·23 cites·10 claims
- 0387US7583098B2Automated probe card planarization and alignment methods and toolsSV PROBE PTE LTD·Filed 2007·Granted Sep 1, 2009·19 cites·11 claims
- 0487US7364461B1Direct attachment of coaxial cablesSV PROBE PTE LTD·Filed 2007·Granted Apr 29, 2008·31 cites·6 claims
- 0587US7279917B2Stacked tip cantilever electrical connectorSV PROBE PTE LTD·Filed 2005·Granted Oct 9, 2007·22 cites·12 claims
- 0686US7462800B2Method of shaping lithographically-produced probe elementsSV PROBE PTE LTD·Filed 2005·Granted Dec 9, 2008·16 cites·9 claims
- 0786US7271602B2Probe card assembly and method of attaching probes to the probe card assemblySV PROBE PTE LTD·Filed 2005·Granted Sep 18, 2007·11 cites·22 claims
- 0886US7173441B2Prefabricated and attached interconnect structureSV PROBE PTE LTD·Filed 2004·Granted Feb 6, 2007·33 cites·18 claims
- 0985US7721430B2Approach for fabricating cantilever probesSV PROBE PTE LTD·Filed 2007·Granted May 25, 2010·18 cites·20 claims
- 1085US7437813B2Probe repair methodsSV PROBE PTE LTD·Filed 2007·Granted Oct 21, 2008·21 cites·10 claims
- 1184US7637007B2Approach for fabricating cantilever probes for probe card assembliesSV PROBE PTE LTD·Filed 2007·Granted Dec 29, 2009·16 cites·16 claims
- 1279US7182672B2Method of probe tip shaping and cleaningSV PROBE PTE LTD·Filed 2005·Granted Feb 27, 2007·16 cites·23 claims
- 1376US8004299B2Cantilever probe structure for a probe card assemblySV PROBE PTE LTD·Filed 2011·Granted Aug 23, 2011·3 cites·10 claims
- 1473US7479794B2Spring loaded probe pin assemblySV PROBE PTE LTD·Filed 2007·Granted Jan 20, 2009·10 cites·8 claims
- 1571US7898276B2Probe card with stacked substrateSV PROBE PTE LTD·Filed 2006·Granted Mar 1, 2011·4 cites·15 claims
- 1671US7495459B2Probe card assembly with a dielectric strip structure coupled to a side of at least a portion of the probesSV PROBE PTE LTD·Filed 2007·Granted Feb 24, 2009·3 cites·10 claims
- 1771US7393773B2Method and apparatus for producing co-planar bonding pads on a substrateSV PROBE PTE LTD·Filed 2005·Granted Jul 1, 2008·7 cites·18 claims
- 1865US7808260B2Probes for a wafer test apparatusSV PROBE PTE LTD·Filed 2006·Granted Oct 5, 2010·3 cites·22 claims
- 1965US7637006B2Beam assembly method for large area array multi-beam DUT probe cardsSV PROBE PTE LTD·Filed 2007·Granted Dec 29, 2009·5 cites·17 claims
- 2063US7432728B2Blade probe and blade probe cardSV PROBE PTE LTD·Filed 2007·Granted Oct 7, 2008·4 cites·17 claims
- 2162US7679383B2Cantilever probe cardSV PROBE PTE LTD·Filed 2007·Granted Mar 16, 2010·4 cites·22 claims
- 2262US7675302B2Probe card assembly and method of attaching probes to the probe card assemblySV PROBE PTE LTD·Filed 2007·Granted Mar 9, 2010·1 cites·17 claims
- 2359US8026734B2Dual tip test probe assemblySV PROBE PTE LTD·Filed 2009·Granted Sep 27, 2011·3 cites·15 claims
- 2451US7311239B2Probe attach toolSV PROBE PTE LTD·Filed 2004·Granted Dec 25, 2007·6 cites·14 claims
- 2546US7374811B2Probe pad structure in a ceramic space transformerSV PROBE PTE LTD·Filed 2006·Granted May 20, 2008·0 cites·11 claims
- 2641US2019265277A1Circuit board for testing and method of operating the sameSV PROBE PTE LTD·Filed 2018·Application pending·0 cites
- 2735US7733104B2Low force interconnects for probe cardsSV PROBE PTE LTD·Filed 2008·Granted Jun 8, 2010·0 cites·11 claims
- 2829US7637009B2Approach for fabricating probe elements for probe card assemblies using a reusable substrateSV PROBE PTE LTD·Filed 2007·Granted Dec 29, 2009·0 cites·15 claims
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