Assignee
SUN STUDS
13 granted patents·202 citations·filing 1975–1984
Top patents by PatentIndex Score
13 records- 0191US3992615AElectro-optical ranging system for distance measurements to moving targetsSUN STUDS·Filed 1975·Granted Nov 16, 1976·63 cites·13 claims
- 0285US4086496AMethod for optically measuring a cant to locate the narrowest flat side and its boundaries and manufacturing lumber therefromSUN STUDS·Filed 1977·Granted Apr 25, 1978·45 cites·7 claims
- 0353US4506714AVeneer latheSUN STUDS·Filed 1983·Granted Mar 26, 1985·19 cites·29 claims
- 0449US4384601AVeneer lathe log charger system having enhanced accuracy and rate of productionSUN STUDS·Filed 1981·Granted May 24, 1983·13 cites·2 claims
- 0546US4494588AVeneer latheSUN STUDS·Filed 1983·Granted Jan 22, 1985·10 cites·4 claims
- 0644US4557304ABlock stabilizer for veneer latheSUN STUDS·Filed 1984·Granted Dec 10, 1985·9 cites·12 claims
- 0743US4379477AVeneer lathe log charger system having enhanced accuracy and rate of productionSUN STUDS·Filed 1981·Granted Apr 12, 1983·9 cites·13 claims
- 0842US4379476AVeneer lathe log charger system having enhanced accuracy and rate of productionSUN STUDS·Filed 1981·Granted Apr 12, 1983·9 cites·7 claims
- 0938US4378829AVeneer lathe log charger system having enhanced accuracy and rate of productionSUN STUDS·Filed 1981·Granted Apr 5, 1983·9 cites·8 claims
- 1033US4529021ABlock stabilizer for veneer lathe and method for operating sameSUN STUDS·Filed 1984·Granted Jul 16, 1985·6 cites·15 claims
- 1131US4398580AVeneer lathe log charger system having enhanced accuracy and rate of productionSUN STUDS·Filed 1981·Granted Aug 16, 1983·5 cites·11 claims
- 1228US4378827AVeneer lathe lug charger system having enhanced accuracy and rate of productionSUN STUDS·Filed 1981·Granted Apr 5, 1983·5 cites·3 claims
- 1310US4378830AVeneer lathe log charger system having enhanced accuracy and rate of productionSUN STUDS·Filed 1981·Granted Apr 5, 1983·0 cites·6 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →