Assignee
STROM JOHN T
US·2 granted patents·1 pending application·3 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0177US8198906B2Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufactureSTROM JOHN T·Filed 2010·Granted Jun 12, 2012·3 cites·24 claims
- 0249US2012150475A1Apparatus for obtaining planarity measurements with respect to a probe card analysis systemSTROM JOHN T·Filed 2011·Application pending·0 cites
- 0343US8089292B2System and method of measuring probe floatSTROM JOHN T·Filed 2009·Granted Jan 3, 2012·0 cites·20 claims
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