Assignee
SONY MFG SYS CORP
JP·2 granted patents·23 citations·filing 2002–2003
Top patents by PatentIndex Score
2 records- 0174US7171039B2Defect classification/inspection systemSONY MFG SYS CORP·Filed 2002·Granted Jan 30, 2007·23 cites·6 claims
- 0237US7187449B2Light-receiving/emitting composite unit, method for manufacturing the same, and displacement detection deviceSONY MFG SYS CORP·Filed 2003·Granted Mar 6, 2007·0 cites·10 claims
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