Assignee
SOCARRAS ANGEL
US·3 granted patents·2 citations·filing 2012–2012
Top patents by PatentIndex Score
3 records- 0167US8914691B2Methods and systems for performing scan testing to identify logic device defectsSOCARRAS ANGEL·Filed 2012·Granted Dec 16, 2014·2 cites·15 claims
- 0246US9037931B2Methods and systems for logic device defect tolerant redundancySOCARRAS ANGEL·Filed 2012·Granted May 19, 2015·0 cites·25 claims
- 0344US8819511B2Methods and systems for an automated test configuration to identify logic device defectsSOCARRAS ANGEL·Filed 2012·Granted Aug 26, 2014·0 cites·20 claims
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