Assignee
SILICON TEST SYSTEMS INC
US·0 granted patents·2 pending applications·0 citations·filing 2007–2007
Top patents by PatentIndex Score
2 records- 0146US2008099232A1Three-dimensional printed circuit board for use with electronic circuitrySILICON TEST SYSTEMS INC·Filed 2007·Application pending·0 cites
- 0238US2008100323A1Low cost, high pin count, wafer sort automated test equipment (ate) device under test (dut) interface for testing electronic devices in high parallelismSILICON TEST SYSTEMS INC·Filed 2007·Application pending·0 cites
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