Assignee
SEMYRE PHOTONIC SYSTEMS AB
SE·3 granted patents·11 citations·filing 2000–2000
Top patents by PatentIndex Score
3 records- 0152US6768544B1Method and a system for detecting impurities in a transparent materialSEMYRE PHOTONIC SYSTEMS AB·Filed 2000·Granted Jul 27, 2004·4 cites·14 claims
- 0249US6646736B1Method for calibrating equipment for detecting impurities in transparent materialSEMYRE PHOTONIC SYSTEMS AB·Filed 2000·Granted Nov 11, 2003·2 cites·6 claims
- 0342US6594015B1Method and a device for calibrating equipment for determining the surface uniformity of film or sheet materialSEMYRE PHOTONIC SYSTEMS AB·Filed 2000·Granted Jul 15, 2003·5 cites·8 claims
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