Assignee
SCHLUMBERGER TECHNOLOGIES INC
US·112 granted patents·3 pending applications·6,369 citations·filing 1986–2002
Top patents by PatentIndex Score
115 records- 0197US6308317B1Using a high level programming language with a microcontrollerSCHLUMBERGER TECHNOLOGIES INC·Filed 1997·Granted Oct 23, 2001·248 cites·87 claims
- 0297US6252412B1Method of detecting defects in patterned substratesSCHLUMBERGER TECHNOLOGIES INC·Filed 1999·Granted Jun 26, 2001·344 cites·19 claims
- 0397US4945500ATriangle processor for 3-D graphics display systemSCHLUMBERGER TECHNOLOGIES INC·Filed 1989·Granted Jul 31, 1990·158 cites·25 claims
- 0496US6232787B1Microstructure defect detectionSCHLUMBERGER TECHNOLOGIES INC·Filed 1999·Granted May 15, 2001·249 cites·42 claims
- 0596US5530372AMethod of probing a net of an IC at an optimal probe-pointSCHLUMBERGER TECHNOLOGIES INC·Filed 1994·Granted Jun 25, 1996·140 cites·17 claims
- 0696US5475624ATest generation by environment emulationSCHLUMBERGER TECHNOLOGIES INC·Filed 1992·Granted Dec 12, 1995·138 cites·28 claims
- 0796US4901064ANormal vector shading for 3-D graphics display systemSCHLUMBERGER TECHNOLOGIES INC·Filed 1987·Granted Feb 13, 1990·156 cites·6 claims
- 0895US6344750B1Voltage contrast method for semiconductor inspection using low voltage particle beamSCHLUMBERGER TECHNOLOGIES INC·Filed 1999·Granted Feb 5, 2002·217 cites·18 claims
- 0995US6091249AMethod and apparatus for detecting defects in wafersSCHLUMBERGER TECHNOLOGIES INC·Filed 1998·Granted Jul 18, 2000·236 cites·42 claims
- 1095US5675499AOptimal probe point placementSCHLUMBERGER TECHNOLOGIES INC·Filed 1996·Granted Oct 7, 1997·130 cites·11 claims
- 1193US5616921ASelf-masking FIB millingSCHLUMBERGER TECHNOLOGIES INC·Filed 1994·Granted Apr 1, 1997·108 cites·27 claims
- 1293US5109430AMask alignment and measurement of critical dimensions in integrated circuitsSCHLUMBERGER TECHNOLOGIES INC·Filed 1990·Granted Apr 28, 1992·119 cites·33 claims
- 1392US6462814B1Beam delivery and imaging for optical probing of a device operating under electrical testSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Oct 8, 2002·56 cites·22 claims
- 1491US6078845AApparatus for carrying semiconductor devicesSCHLUMBERGER TECHNOLOGIES INC·Filed 1996·Granted Jun 20, 2000·111 cites·15 claims
- 1591US5212443AEvent sequencer for automatic test equipmentSCHLUMBERGER TECHNOLOGIES INC·Filed 1990·Granted May 18, 1993·79 cites·19 claims
- 1690US6501288B1On-chip optically triggered latch for IC time measurementsSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Dec 31, 2002·47 cites·16 claims
- 1790US6420888B1Test system and associated interface moduleSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Jul 16, 2002·72 cites·24 claims
- 1890US6308270B1Validating and certifying execution of a software program with a smart cardSCHLUMBERGER TECHNOLOGIES INC·Filed 1998·Granted Oct 23, 2001·156 cites·49 claims
- 1990US6252222B1Differential pulsed laser beam probing of integrated circuitsSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Jun 26, 2001·49 cites·26 claims
- 2090US5654657AAccurate alignment of clocks in mixed-signal testerSCHLUMBERGER TECHNOLOGIES INC·Filed 1995·Granted Aug 5, 1997·126 cites·14 claims
- 2190US5401972ALayout overlay for FIB operationsSCHLUMBERGER TECHNOLOGIES INC·Filed 1993·Granted Mar 28, 1995·62 cites·21 claims
- 2290US5297057AMethod and apparatus for design and optimization for simulation of motion of mechanical linkagesSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted Mar 22, 1994·131 cites·18 claims
- 2389US4931723AAutomatic test system having a "true tester-per-pin" architectureSCHLUMBERGER TECHNOLOGIES INC·Filed 1988·Granted Jun 5, 1990·83 cites·19 claims
- 2488US6410924B1Energy filtered focused ion beam columnSCHLUMBERGER TECHNOLOGIES INC·Filed 1999·Granted Jun 25, 2002·64 cites·1 claims
- 2588US5604819ADetermining offset between images of an ICSCHLUMBERGER TECHNOLOGIES INC·Filed 1993·Granted Feb 18, 1997·73 cites·18 claims
- 2687US5821549AThrough-the-substrate investigation of flip-chip IC'sSCHLUMBERGER TECHNOLOGIES INC·Filed 1997·Granted Oct 13, 1998·79 cites·17 claims
- 2786US5477139AEvent sequencer for automatic test equipmentSCHLUMBERGER TECHNOLOGIES INC·Filed 1993·Granted Dec 19, 1995·53 cites·16 claims
- 2885US7093177B2Low-jitter clock for test systemSCHLUMBERGER TECHNOLOGIES INC·Filed 2002·Granted Aug 15, 2006·35 cites·36 claims
- 2985US5905577ADual-laser voltage probing of IC'sSCHLUMBERGER TECHNOLOGIES INC·Filed 1997·Granted May 18, 1999·59 cites·30 claims
- 3085US5461310AAutomatic test equipment system using pin slice architectureSCHLUMBERGER TECHNOLOGIES INC·Filed 1994·Granted Oct 24, 1995·57 cites·16 claims
- 3184US6612159B1Overlay registration error measurement made simultaneously for more than two semiconductor wafer layersSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Sep 2, 2003·68 cites·20 claims
- 3283US6496261B1Double-pulsed optical interferometer for waveform probing of integrated circuitsSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Dec 17, 2002·29 cites·37 claims
- 3383US5430400ADriver circuits for IC testerSCHLUMBERGER TECHNOLOGIES INC·Filed 1993·Granted Jul 4, 1995·56 cites·7 claims
- 3483US5253189AQualitative kinematicsSCHLUMBERGER TECHNOLOGIES INC·Filed 1989·Granted Oct 12, 1993·70 cites·35 claims
- 3583US4994732AAutomatic test system having a "true tester-per-pin" architectureSCHLUMBERGER TECHNOLOGIES INC·Filed 1989·Granted Feb 19, 1991·52 cites·35 claims
- 3683US4864629AImage correlation systemSCHLUMBERGER TECHNOLOGIES INC·Filed 1987·Granted Sep 5, 1989·74 cites·9 claims
- 3782US5905266ACharged particle beam system with optical microscopeSCHLUMBERGER TECHNOLOGIES INC·Filed 1996·Granted May 18, 1999·46 cites·22 claims
- 3882US5892949AATE test programming architectureSCHLUMBERGER TECHNOLOGIES INC·Filed 1996·Granted Apr 6, 1999·111 cites·27 claims
- 3982US5043929AClosed-form kinematicsSCHLUMBERGER TECHNOLOGIES INC·Filed 1989·Granted Aug 27, 1991·86 cites·43 claims
- 4082US4943020AManipulator apparatusSCHLUMBERGER TECHNOLOGIES INC·Filed 1988·Granted Jul 24, 1990·53 cites·11 claims
- 4181US5140164AIc modification with focused ion beam systemSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted Aug 18, 1992·78 cites·5 claims
- 4280US6252705B1Stage for charged particle microscopy systemSCHLUMBERGER TECHNOLOGIES INC·Filed 1999·Granted Jun 26, 2001·65 cites·46 claims
- 4380US5646521AAnalog channel for mixed-signal-VLSI testerSCHLUMBERGER TECHNOLOGIES INC·Filed 1995·Granted Jul 8, 1997·65 cites·22 claims
- 4480US5144225AMethods and apparatus for acquiring data from intermittently failing circuitsSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted Sep 1, 1992·46 cites·11 claims
- 4579US6492797B1Socket calibration method and apparatusSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Dec 10, 2002·31 cites·13 claims
- 4679US5225772AAutomatic test equipment system using pin slice architectureSCHLUMBERGER TECHNOLOGIES INC·Filed 1990·Granted Jul 6, 1993·43 cites·8 claims
- 4778US4862067AMethod and apparatus for in-circuit testing of electronic devicesSCHLUMBERGER TECHNOLOGIES INC·Filed 1989·Granted Aug 29, 1989·43 cites·36 claims
- 4877US5913022ALoading hardware pattern memory in automatic test equipment for testing circuitsSCHLUMBERGER TECHNOLOGIES INC·Filed 1995·Granted Jun 15, 1999·60 cites·36 claims
- 4977US5394098AApparatus including electro-optical material for use in testing a circuit having voltage-bearing elements proximate a surface of a bodySCHLUMBERGER TECHNOLOGIES INC·Filed 1993·Granted Feb 28, 1995·47 cites·30 claims
- 5077US5392222ALocating a field of view in which selected IC conductors are unobscuredSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted Feb 21, 1995·61 cites·39 claims
Showing the top 50 of 115 patent records by PatentIndex Score.
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