Individual holder
SCHIETINGER CHARLES W
0 granted patents·2 pending applications·0 citations·filing 2005–2005
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
2 records- 0145US2006190211A1In-situ wafer parameter measurement method employing a hot susceptor as radiation source for reflectance measurementSCHIETINGER CHARLES W·Filed 2005·Application pending·0 cites
- 0243US2007095812A1In-situ wafer parameter measurement method employing a hot susceptor as a reflected light sourceSCHIETINGER CHARLES W·Filed 2005·Application pending·0 cites
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