Assignee
SATOU NORIO
JP·2 granted patents·5 citations·filing 2009–2012
Technology mixG06T2
Top patents by PatentIndex Score
2 records- 0165US8121393B2Pattern defect analysis equipment, pattern defect analysis method and pattern defect analysis programSATOU NORIO·Filed 2009·Granted Feb 21, 2012·4 cites·9 claims
- 0258US8280148B2Pattern defect analysis equipment, pattern defect analysis method and pattern defect analysis programSATOU NORIO·Filed 2012·Granted Oct 2, 2012·1 cites·9 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →