Assignee
SANEYOSHI EISUKE
JP·2 granted patents·1 pending application·7 citations·filing 2008–2012
Top patents by PatentIndex Score
3 records- 0182US8674774B2Aging diagnostic device, aging diagnostic methodSANEYOSHI EISUKE·Filed 2010·Granted Mar 18, 2014·6 cites·7 claims
- 0249US8444316B2Temperature measuring device and methodSANEYOSHI EISUKE·Filed 2008·Granted May 21, 2013·1 cites·19 claims
- 0338US2014218060A1Degradation diagnosing circuit and degradation diagnosing methodSANEYOSHI EISUKE·Filed 2012·Application pending·0 cites
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