Assignee
RYCHEN JOERG
CH·3 granted patents·6 citations·filing 2006–2010
Top patents by PatentIndex Score
3 records- 0173US8884222B2Mount for a scanning probe sensor package, scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor packageRYCHEN JOERG·Filed 2010·Granted Nov 11, 2014·5 cites·16 claims
- 0242US8245316B2Scanning probe microscope with periodically phase-shifted AC excitationRYCHEN JOERG·Filed 2006·Granted Aug 14, 2012·1 cites·11 claims
- 0337US8296857B2Scanning probe microscope with current controlled actuatorRYCHEN JOERG·Filed 2008·Granted Oct 23, 2012·0 cites·12 claims
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