Assignee
RUDMANN HARTMUT
CH·11 granted patents·2 pending applications·39 citations·filing 2006–2012
Top patents by PatentIndex Score
13 records- 0192US9485397B2Camera, and method of manufacturing a plurality of camerasRUDMANN HARTMUT·Filed 2011·Granted Nov 1, 2016·15 cites·24 claims
- 0286US8582022B2Optical module, wafer scale package, and method for manufacturing thoseRUDMANN HARTMUT·Filed 2008·Granted Nov 12, 2013·8 cites·20 claims
- 0383US9966493B2Opto-electronic modules and methods of manufacturing the same and appliances and devices comprising the sameRUDMANN HARTMUT·Filed 2012·Granted May 8, 2018·5 cites·20 claims
- 0478US8221665B2Manufacturing a replication tool, sub-master or replicaRUDMANN HARTMUT·Filed 2006·Granted Jul 17, 2012·8 cites·14 claims
- 0566US8828174B2Method of manufacturing a plurality of optical devicesRUDMANN HARTMUT·Filed 2009·Granted Sep 9, 2014·1 cites·18 claims
- 0664US8767303B2Method for manufacturing passive optical components, and devices comprising the sameRUDMANN HARTMUT·Filed 2012·Granted Jul 1, 2014·1 cites·18 claims
- 0761US9237264B2Method of manufacturing a plurality of optical devices for camerasRUDMANN HARTMUT·Filed 2011·Granted Jan 12, 2016·1 cites·8 claims
- 0854US9011742B2Manufacturing micro-structured elementsRUDMANN HARTMUT·Filed 2010·Granted Apr 21, 2015·0 cites·4 claims
- 0952US8962079B2Manufacturing optical elementsRUDMANN HARTMUT·Filed 2008·Granted Feb 24, 2015·0 cites·21 claims
- 1052US2013162882A1Method of Manufacturing Plurality of Optical DevicesRUDMANN HARTMUT·Filed 2011·Application pending·0 cites
- 1147US9224772B2Opto-electronic module and method for manufacturing the sameRUDMANN HARTMUT·Filed 2012·Granted Dec 29, 2015·0 cites·42 claims
- 1245US10444477B2Wafer-level fabrication of optical devices with front focal length correctionRUDMANN HARTMUT·Filed 2012·Granted Oct 15, 2019·0 cites·39 claims
- 1345US2014002902A1Manufacturing a Plurality of Optical ElementsRUDMANN HARTMUT·Filed 2012·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →