Individual holder
ROY ERWAN L
0 granted patents·2 pending applications·0 citations·filing 2005–2005
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
2 records- 0137US2005236583A1Method and apparatus for determining thickness of a semiconductor substrate at the floor of a trenchROY ERWAN L·Filed 2005·Application pending·0 cites
- 0232US2006008929A1Method and apparatus for the improvement of material/voltage contrastROY ERWAN L·Filed 2005·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →