Assignee
RIHO YOSHIRO
JP·10 granted patents·65 citations·filing 2009–2014
Top patents by PatentIndex Score
10 records- 0195US8243486B2Semiconductor deviceRIHO YOSHIRO·Filed 2010·Granted Aug 14, 2012·16 cites·21 claims
- 0293US8310855B2Semiconductor deviceRIHO YOSHIRO·Filed 2010·Granted Nov 13, 2012·15 cites·27 claims
- 0392US8483986B2Semiconductor device, system with semiconductor device, and calibration methodRIHO YOSHIRO·Filed 2010·Granted Jul 9, 2013·17 cites·18 claims
- 0485US8788738B2Semiconductor device and method of manufacturing the sameRIHO YOSHIRO·Filed 2011·Granted Jul 22, 2014·6 cites·10 claims
- 0572US8737149B2Semiconductor device performing stress testRIHO YOSHIRO·Filed 2011·Granted May 27, 2014·4 cites·6 claims
- 0667US8503261B2Semiconductor deviceRIHO YOSHIRO·Filed 2012·Granted Aug 6, 2013·1 cites·20 claims
- 0763US8116156B2Semiconductor memory deviceRIHO YOSHIRO·Filed 2009·Granted Feb 14, 2012·5 cites·9 claims
- 0856US8837242B2Semiconductor device and method including redundant bit line provided to replace defective bit lineRIHO YOSHIRO·Filed 2014·Granted Sep 16, 2014·1 cites·17 claims
- 0942US8638625B2Semiconductor device having redundant bit line provided to replace defective bit lineRIHO YOSHIRO·Filed 2012·Granted Jan 28, 2014·0 cites·14 claims
- 1037US8422329B2Semiconductor device with anti-fuse elementsRIHO YOSHIRO·Filed 2011·Granted Apr 16, 2013·0 cites·14 claims
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