Assignee
REITINGER ERICH
3 granted patents·1 pending application·143 citations·filing 1992–2009
Top patents by PatentIndex Score
4 records- 0190US5220277AArrangement for testing semiconductor wafers or the likeREITINGER ERICH·Filed 1992·Granted Jun 15, 1993·130 cites·15 claims
- 0282US7271604B2Method and apparatus for testing semiconductor wafers by means of a temperature-regulated chuck deviceREITINGER ERICH·Filed 2005·Granted Sep 18, 2007·13 cites·14 claims
- 0344US9177845B2Method and apparatus for thermally processing plastic discs, in particular mould wafersREITINGER ERICH·Filed 2009·Granted Nov 3, 2015·0 cites·11 claims
- 0431US2006114012A1Method and apparatus for testing semiconductor wafers by means of a probe cardREITINGER ERICH·Filed 2005·Application pending·0 cites
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