Assignee
REILLY DANIEL L
US·2 granted patents·7 citations·filing 2008–2012
Technology mixG01R2
Top patents by PatentIndex Score
2 records- 0169US8141026B1Method and system for rapidly identifying silicon manufacturing defectsREILLY DANIEL L·Filed 2008·Granted Mar 20, 2012·7 cites·12 claims
- 0243US8701072B1Method and system for rapidly identifying silicon manufacturing defectsREILLY DANIEL L·Filed 2012·Granted Apr 15, 2014·0 cites·20 claims
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