Assignee
POSTOLOV YURI
IL·5 granted patents·3 citations·filing 2006–2017
Top patents by PatentIndex Score
5 records- 0164US8238645B2Inspection system and a method for detecting defects based upon a reference framePOSTOLOV YURI·Filed 2006·Granted Aug 7, 2012·2 cites·18 claims
- 0258US8233699B2Inspection system and a method for detecting defects based upon a reference framePOSTOLOV YURI·Filed 2006·Granted Jul 31, 2012·1 cites·8 claims
- 0348US10203289B2Inspection system and a method for inspecting a diced waferPOSTOLOV YURI·Filed 2006·Granted Feb 12, 2019·0 cites·36 claims
- 0440US8208713B2Method and system for inspecting a diced waferPOSTOLOV YURI·Filed 2009·Granted Jun 26, 2012·0 cites·19 claims
- 0535US10042974B2Inspecting a wafer using image and design informationPOSTOLOV YURI·Filed 2017·Granted Aug 7, 2018·0 cites·19 claims
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