Individual holder
PELLETIER MICHAEL T
US·22 granted patents·3 pending applications·132 citations·filing 2008–2012
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
25 records- 0198US8619256B1Systems and methods for monitoring the properties of a fluid cement composition in a flow pathPELLETIER MICHAEL T·Filed 2012·Granted Dec 31, 2013·56 cites·20 claims
- 0296US9238864B2Controlled coating apparatus, systems, and methodsPELLETIER MICHAEL T·Filed 2012·Granted Jan 19, 2016·9 cites·13 claims
- 0395US9228940B2Systems, methods, and apparatuses for in situ monitoring of cement fluid compositions and setting processes thereofPELLETIER MICHAEL T·Filed 2012·Granted Jan 5, 2016·13 cites·17 claims
- 0491US9016399B2Apparatus and methods for lithology and mineralogy determinationsPELLETIER MICHAEL T·Filed 2011·Granted Apr 28, 2015·10 cites·22 claims
- 0586US9234835B2Apparatus and method for analysis of a fluid samplePELLETIER MICHAEL T·Filed 2009·Granted Jan 12, 2016·9 cites·13 claims
- 0685US9157311B2Method and system of determining constituent components of a fluid samplePELLETIER MICHAEL T·Filed 2010·Granted Oct 13, 2015·5 cites·37 claims
- 0779US8946660B2Downhole sources having enhanced IR emissionPELLETIER MICHAEL T·Filed 2010·Granted Feb 3, 2015·5 cites·9 claims
- 0874US9182518B2Sensor conditioning apparatus, systems, and methodsPELLETIER MICHAEL T·Filed 2012·Granted Nov 10, 2015·2 cites·21 claims
- 0971US10012070B2System and method for measuring gaps using an opto-analytical devicePELLETIER MICHAEL T·Filed 2012·Granted Jul 3, 2018·3 cites·24 claims
- 1065US9945181B2System and method for detecting drilling events using an opto-analytical devicePELLETIER MICHAEL T·Filed 2012·Granted Apr 17, 2018·2 cites·27 claims
- 1165US9885234B2System and method for measuring temperature using an opto-analytical devicePELLETIER MICHAEL T·Filed 2012·Granted Feb 6, 2018·2 cites·25 claims
- 1264US10167718B2System and method for analyzing downhole drilling parameters using an opto-analytical devicePELLETIER MICHAEL T·Filed 2012·Granted Jan 1, 2019·2 cites·22 claims
- 1364US9249659B2Formation fluid property determinationPELLETIER MICHAEL T·Filed 2009·Granted Feb 2, 2016·7 cites·26 claims
- 1463US10012067B2System and method for determining torsion using an opto-analytical devicePELLETIER MICHAEL T·Filed 2012·Granted Jul 3, 2018·2 cites·21 claims
- 1563US9957792B2System and method for analyzing cuttings using an opto-analytical devicePELLETIER MICHAEL T·Filed 2012·Granted May 1, 2018·1 cites·25 claims
- 1660US10006279B2System and method for detecting vibrations using an opto-analytical devicePELLETIER MICHAEL T·Filed 2012·Granted Jun 26, 2018·1 cites·18 claims
- 1757US9052124B2Very high pressure sample capture and transportation vesselPELLETIER MICHAEL T·Filed 2010·Granted Jun 9, 2015·0 cites·2 claims
- 1855US8695414B2High pressure and flow rate pump useful in formation fluid sample testingPELLETIER MICHAEL T·Filed 2012·Granted Apr 15, 2014·0 cites·28 claims
- 1954US8955376B2Formation fluid sampling controlPELLETIER MICHAEL T·Filed 2009·Granted Feb 17, 2015·3 cites·21 claims
- 2051US10094955B2Method for fabrication of a multivariate optical elementPELLETIER MICHAEL T·Filed 2011·Granted Oct 9, 2018·0 cites·6 claims
- 2144US8581591B2Method and system of determining an electrical property of a formation fluidPELLETIER MICHAEL T·Filed 2008·Granted Nov 12, 2013·0 cites·22 claims
- 2242US8733163B2Formation evaluation probe set quality and data acquisition methodPELLETIER MICHAEL T·Filed 2010·Granted May 27, 2014·0 cites·28 claims
- 2342US2013312481A1Fluid properties including equation of state modeling with optical constraintsPELLETIER MICHAEL T·Filed 2011·Application pending·0 cites
- 2442US2014076549A1Systems and Methods for In Situ Monitoring of Cement Slurry Locations and Setting Processes ThereofPELLETIER MICHAEL T·Filed 2012·Application pending·0 cites
- 2542US2014076550A1Systems and Methods for Detecting Microannulus Formation and RemediationPELLETIER MICHAEL T·Filed 2012·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →