Assignee
PARK SCIENT INSTR
US·12 granted patents·925 citations·filing 1991–1997
Top patents by PatentIndex Score
12 records- 0196US5376790AScanning probe microscopePARK SCIENT INSTR·Filed 1992·Granted Dec 27, 1994·197 cites·57 claims
- 0295US5714756AScanning probe microscope having a single viewing device for on-axis and oblique angle viewsPARK SCIENT INSTR·Filed 1996·Granted Feb 3, 1998·127 cites·19 claims
- 0394US5743998AProcess for transferring microminiature patterns using spin-on glass resist mediaPARK SCIENT INSTR·Filed 1995·Granted Apr 28, 1998·112 cites·54 claims
- 0492US5672816ALarge stage system for scanning probe microscopes and other instrumentsPARK SCIENT INSTR·Filed 1995·Granted Sep 30, 1997·162 cites·23 claims
- 0588US5448399AOptical system for scanning microscopePARK SCIENT INSTR·Filed 1992·Granted Sep 5, 1995·58 cites·8 claims
- 0686US5157251AScanning force microscope having aligning and adjusting meansPARK SCIENT INSTR·Filed 1991·Granted Oct 20, 1992·60 cites·33 claims
- 0781US5811821ASingle axis vibration reducing systemPARK SCIENT INSTR·Filed 1996·Granted Sep 22, 1998·64 cites·22 claims
- 0874US5854487AScanning probe microscope providing unobstructed top down and bottom up viewsPARK SCIENT INSTR·Filed 1997·Granted Dec 29, 1998·40 cites·48 claims
- 0971US5877891AScanning probe microscope having a single viewing device for on-axis and oblique optical viewsPARK SCIENT INSTR·Filed 1995·Granted Mar 2, 1999·27 cites·22 claims
- 1070US6130427AScanning probe microscope with multimode headPARK SCIENT INSTR·Filed 1997·Granted Oct 10, 2000·24 cites·35 claims
- 1164USRE35514EScanning force microscope having aligning and adjusting meansPARK SCIENT INSTR·Filed 1994·Granted May 20, 1997·23 cites·1 claims
- 1261US5861624AAtomic force microscope for attachment to optical microscopePARK SCIENT INSTR·Filed 1997·Granted Jan 19, 1999·31 cites·61 claims
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