Assignee
PAGANI ALBERTO
IT·23 granted patents·102 citations·filing 2008–2012
Top patents by PatentIndex Score
23 records- 0192US9224694B2Traceable integrated circuits and production method thereofPAGANI ALBERTO·Filed 2011·Granted Dec 29, 2015·11 cites·17 claims
- 0292US9111895B2System and method for electrical testing of through silicon vias (TSVs)PAGANI ALBERTO·Filed 2011·Granted Aug 18, 2015·10 cites·28 claims
- 0391US9541601B2Testing architecture of circuits integrated on a waferPAGANI ALBERTO·Filed 2012·Granted Jan 10, 2017·9 cites·14 claims
- 0491US9146273B2Process for controlling the correct positioning of test probes on terminations of electronic devices integrated on a semiconductor and corresponding electronic devicePAGANI ALBERTO·Filed 2010·Granted Sep 29, 2015·8 cites·25 claims
- 0589US9188635B2Integrated circuit comprising at least an integrated antennaPAGANI ALBERTO·Filed 2012·Granted Nov 17, 2015·6 cites·44 claims
- 0688US9112263B2Electronic communications device with antenna and electromagnetic shieldPAGANI ALBERTO·Filed 2011·Granted Aug 18, 2015·8 cites·26 claims
- 0786US9134367B2Sensing structure of alignment of a probe for testing integrated circuitsPAGANI ALBERTO·Filed 2011·Granted Sep 15, 2015·5 cites·25 claims
- 0885US9097637B2Integrated electronic device for monitoring parameters within a solid structure and monitoring system using such a devicePAGANI ALBERTO·Filed 2011·Granted Aug 4, 2015·5 cites·27 claims
- 0985US9000788B2Method for performing an electrical testing of electronic devicesPAGANI ALBERTO·Filed 2009·Granted Apr 7, 2015·12 cites·32 claims
- 1085US8907693B2Electromagnetic shield for testing integrated circuitsPAGANI ALBERTO·Filed 2010·Granted Dec 9, 2014·4 cites·21 claims
- 1182US8902016B2Signal transmission through LC resonant circuitsPAGANI ALBERTO·Filed 2010·Granted Dec 2, 2014·7 cites·50 claims
- 1275US9929089B2Inductive connection structure for use in an integrated circuitPAGANI ALBERTO·Filed 2011·Granted Mar 27, 2018·3 cites·35 claims
- 1375US8791711B2Testing of electronic devices through capacitive interfacePAGANI ALBERTO·Filed 2010·Granted Jul 29, 2014·2 cites·51 claims
- 1474US8604570B2Integrated electronic device with transceiving antenna and magnetic interconnectionPAGANI ALBERTO·Filed 2009·Granted Dec 10, 2013·4 cites·50 claims
- 1569US8941401B2Test circuit of an integrated circuit on a waferPAGANI ALBERTO·Filed 2011·Granted Jan 27, 2015·2 cites·33 claims
- 1661US8829931B2Testing method for semiconductor integrated electronic devices and corresponding test architecturePAGANI ALBERTO·Filed 2011·Granted Sep 9, 2014·1 cites·17 claims
- 1761US8604816B2Probe card for testing integrated circuitsPAGANI ALBERTO·Filed 2008·Granted Dec 10, 2013·2 cites·39 claims
- 1861US8479066B2Process for making an electric testing of electronic devicesPAGANI ALBERTO·Filed 2011·Granted Jul 2, 2013·1 cites·26 claims
- 1957US8441272B2MEMS probe for probe cards for integrated circuitsPAGANI ALBERTO·Filed 2009·Granted May 14, 2013·2 cites·35 claims
- 2052US9229031B2Probes for testing integrated electronic circuits and corresponding production methodPAGANI ALBERTO·Filed 2011·Granted Jan 5, 2016·0 cites·30 claims
- 2152US8643395B2Crosstalk suppression in wireless testing of semiconductor devicesPAGANI ALBERTO·Filed 2011·Granted Feb 4, 2014·0 cites·12 claims
- 2251US9275962B2Probe pad with indentationPAGANI ALBERTO·Filed 2011·Granted Mar 1, 2016·0 cites·22 claims
- 2344US9008785B2Retinal prosthesisPAGANI ALBERTO·Filed 2011·Granted Apr 14, 2015·0 cites·20 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →