Assignee
OUYANG XU
US·5 granted patents·126 citations·filing 2008–2012
Top patents by PatentIndex Score
5 records- 0197US8225255B2Placement and optimization of process dummy cellsOUYANG XU·Filed 2008·Granted Jul 17, 2012·107 cites·5 claims
- 0285US8095230B2Method for optimizing the routing of wafers/lots based on yieldOUYANG XU·Filed 2008·Granted Jan 10, 2012·10 cites·23 claims
- 0381US8742782B2Noncontact electrical testing with optical techniquesOUYANG XU·Filed 2011·Granted Jun 3, 2014·5 cites·12 claims
- 0478US8294485B2Detecting asymmetrical transistor leakage defectsOUYANG XU·Filed 2010·Granted Oct 23, 2012·4 cites·5 claims
- 0543US9780007B2LCR test circuit structure for detecting metal gate defect conditionsOUYANG XU·Filed 2012·Granted Oct 3, 2017·0 cites·15 claims
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