Assignee
OSANAI YOSUKE
JP·2 granted patents·4 citations·filing 2012–2013
Top patents by PatentIndex Score
2 records- 0166US9379029B2Inspection apparatus, inspection system, inspection method of semiconductor devices, and manufacturing method of inspected semiconductor devicesOSANAI YOSUKE·Filed 2012·Granted Jun 28, 2016·2 cites·10 claims
- 0260US9660512B2Electronic device for acquiring specific information of respective switching elementsOSANAI YOSUKE·Filed 2013·Granted May 23, 2017·2 cites·5 claims
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